The DF-745 provides trace and ultra-trace moisture contaminant measurements for LED/LCD manufacturing processes. Able to monitor multiple background gases, the DF-745 delivers exceptional performance operational flexibility in a compact unit.
With an intelligent and robust hardware/software design, this analyzer can be moved easily from port to port, virtually eliminating dry down times often associated with these applications.
Offering a Lower Detection Limit (LDL) of 1ppb, the DF-745 uses industry-leading Tunable Diode Laser (TDL) sensing technology. This sensor delivers ultra-reliable baseline measurements and a fast speed of response; with a robust Herriot cell preventing loss in mirror reflectivity, moisture contact with optical components is minimized, ensuring an accurate measurement. Added to its flexibility and accuracy is affordability; zero drift extends calibration intervals while minimal ongoing maintenance provides a low cost of lifetime ownership.
