The DF-749 provides trace and ultra-trace moisture contaminant measurements in various background gases including nitrogen, hydrogen, helium, argon and oxygen. Ideal for quality checking of UHP gases used in LCD and LED manufacture, the DF-749’s compact form makes it easily portable for easy cart or mobile use. A robust hardware/software design virtually eliminates dry down times often associated with UHP gas checking.
Offering an ultra-sensitive Lower Detection Limit (LDL) of 250ppt, this device uses industry-leading Tunable Diode Laser (TDL) sensing technology, delivering ultra-reliable baseline measurements and a fast speed of response. This analyzer is also highly affordable over product life, with a robust sensor construction that has low lifetime maintenance requirements and a zero-drift measurement stability that greatly extends calibration intervals. Factory pre-calibration also provides simplified set up.
